STM Lab @ UOW

STM-SNOM-AFM (Unisoku usm-1400 SNOM-SPM system)

This system is developed for local conductance measurement and 4 probe SPM operations in nano to micrometer scale range in UHV and Low temperature. Each probe stage can be used independently for STM/AFM imaging and spectroscopy. Observing the electron microscope (SEM), each probe can approach a specific position of the sample surface.

 

Key Features:

(1) Sample holder and probe holders can be exchanged in UHV.

(2) Variable temperature from 2.5K to 80K using liquid helium, and 80K to RT using liquid nitrogen

(3) Sample stage can be adjustable by 3mm in XY direction.

(4) Each probe can be adjustable 3mm travel in XY direction.

(5) Each probe position can be adjustable mm distance in XYZ direction by computer controlled piezo stages.

(6) All 4 probe stages can scan in atomic resolution.